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| Run-in-test Test Solution |
—— Overview
Run in test is running test. Mainly do medium and long-term aging test and online aging test for the controller. The main purpose is to stimulate early product problems and intercept failure problems (failure analysis) caused by the process/device/system through the aging test of devices and systems.
—— System Composition
• Environment box (incubator): provide the working environment conditions of DUT under test
• Cooling system: cooling the DUT
• High-voltage DC power supply: provide high-voltage DC input to the DUT under test
• Low-voltage DC power supply: low-voltage DC power supply of the DUT under test
• AC power supply: AC power input of OBC module
• High voltage DC load: DC high voltage output load such as PTC, OBC, air conditioner, etc.
• Low voltage DC load: the output load of the DC-DC module
• Three-phase AC load: the simulated motor load output by the tested DUT
• Fixture: interface between DUT and test equipment
• HIL system: vehicle simulation, motor body simulation, communication simulation, data acquisition and control
—— System Block Diagram
—— Typical Working Conditions
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